📖 Multi-Chip Module Test Strategies
Thursday, October 25, 2018 by dev
Multi-Chip Module Test Strategies
By:Yervant Zorian
Published on 2012-12-06 by Springer Science & Business Media
MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
This Book was ranked at 27 by Google Books for keyword chip.
Book ID of Multi-Chip Module Test Strategies's Books is urfeBwAAQBAJ, Book which was written byYervant Zorianhave ETAG "MKb3Iixxceo"
Book which was published by Springer Science & Business Media since 2012-12-06 have ISBNs, ISBN 13 Code is 9781461561071 and ISBN 10 Code is 1461561078
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Book which have "167 Pages" is Printed at BOOK under CategoryTechnology and Engineering
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