📖 Introduction to Advanced System-on-Chip Test Design and Optimization
Tuesday, August 21, 2018 by dev
Introduction to Advanced System-on-Chip Test Design and Optimization
By:Erik Larsson
Published on 2006-03-30 by Springer Science & Business Media
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
This Book was ranked at 17 by Google Books for keyword chip.
Book ID of Introduction to Advanced System-on-Chip Test Design and Optimization's Books is eoEK2JYqV88C, Book which was written byErik Larssonhave ETAG "aK0x9Az4QLY"
Book which was published by Springer Science & Business Media since 2006-03-30 have ISBNs, ISBN 13 Code is 9780387256245 and ISBN 10 Code is 0387256245
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Book which have "388 Pages" is Printed at BOOK under CategoryTechnology and Engineering
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